Microwave seminar | 15 February 2021

In this talk I will review a new concept of deeply subwavelength imaging through far-field diffraction patterns. Retrieval of the object from its far-field diffraction pattern is an ill-posed problem which allows many solutions with one input. Neural network retrieves the general rule how the object is linked with resulting pattern, which enables the technique. So far we have proven the possibility of metrology of deeply subwavelength slits, and currently we are working imaging of objects having different shapes.