Microwave seminar | 15 February 2021

Mr. Sergei Kurdiumov
Optoelectronics Research Centre & Centre for Photonic Metamaterials, University of Southampton, UK
Artificial Intelligence in Deeply Subwavelength Optical Imaging and Metrology
In this talk I will review a new concept of deeply subwavelength imaging through far-field diffraction patterns. Retrieval of the object from its far-field diffraction pattern is an ill-posed problem which allows many solutions with one input. Neural network retrieves the general rule how the object is linked with resulting pattern, which enables the technique. So far we have proven the possibility of metrology of deeply subwavelength slits, and currently we are working imaging of objects having different shapes.