External seminar | 28 June 2024

Dr. Chao Sun
Harbin Engineering University
From Radar Target Scattering Signature Measurement to Terahertz Imaging

Radar cross section (RCS) is an important physical quantity that measures the scattering ability of a target to radar waves, ranging from hundreds of MHz to tens of GHz. RCS is one of the important technical indicators for military targets such as new generation aircraft, ships, and ground vehicles with stealth design. The first part of the report will provide a detailed introduction to the basic principles and methods of RCS measurement, with a focus on near-field to far-field transformation technology to achieve RCS measurement and stealth performance diagnosis of full-scale targets. In RCS measurement, not only RCS value of the target can be obtained, but also the distribution of strong scattering sources on the target can be determined through imaging. Considering that both terahertz imaging and RCS imaging are aimed at obtaining the scattering characteristics distribution of the measured target, the former focusing on internal information of the target, while the latter focusing on the shape of the target, various RCS imaging algorithms or methods can be extended to the field of terahertz imaging. The second part of the report will briefly introduce the application scenarios of terahertz imaging technology and focus on some work carried out in the field of non-destructive testing. The third part of the report will introduce the existing instruments or under construction in Qingdao Microwave Laboratory, which aspects of research work can be supported.