Optical seminar | 04 June 2021

Scanning Near-Field Optical Microscopy (SNOM) breaks the diffraction-related limitation for the optical analysis methods. Recent advancements in scattering SNOM development provide tools to perform artifact-free nanoscale optical characterization with wavelengths from VIS and IR to THz with a broad range of applications in various research fields. This talk introduces the technology of nanoFTIR and shows examples of technology utilization.

Main paper/arXiv, related to the seminar, and other references
https://www.neaspec.com/applications/