Журнал: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

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2022

1.
Introduction of a Reset MOSFET to Mitigate the Influence of Ionic Movement in Perovskite MOSFET Photodetector Measurements
Jinbo Liu
Ross Haroldson
Grigorii Verkhogliadov
Dayang Lin
Qing Gu
Anvar Zakhidov
Wenchuang Hu
Chadwin D Young
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
 , 2022
[DOI:
10.1109/icmts50340.2022.9898238
 ]